Please use this identifier to cite or link to this item: http://hdl.handle.net/1893/31708
Appears in Collections:Computing Science and Mathematics Conference Papers and Proceedings
Author(s): Elawady, Mohamed
Ducottet, Christophe
Alata, Olivier
Barat, Cecile
Colantoni, Philippe
Contact Email: mohamed.elsayed.elawady@stir.ac.uk
Title: Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms: Algorithm and Results
Citation: Elawady M, Ducottet C, Alata O, Barat C & Colantoni P (2017) Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms: Algorithm and Results. In: 2017 IEEE International Conference on Computer Vision Workshops (ICCVW). 2017 IEEE International Conference on Computer Vision Workshop (ICCVW), Venice, Italy, 22.10.2017-29.10.2017. Piscataway, NJ, USA: IEEE. https://doi.org/10.1109/iccvw.2017.203
Issue Date: Oct-2017
Date Deposited: 22-Sep-2020
Conference Name: 2017 IEEE International Conference on Computer Vision Workshop (ICCVW)
Conference Dates: 2017-10-22 - 2017-10-29
Conference Location: Venice, Italy
Abstract: The proposed algorithm detects globally the symmetry axes inside an image plane. The main steps are as follows: We firstly extract edge features using Log-Gabor filters with different scales and orientations. Afterwards, we use the edge characteristics associated with the textural and color information as symmetrical weights for voting triangulation. In the end, we construct a polar-based voting histogram based on the accumulation of the symmetry contribution (local texture and color information), in order to find the maximum peaks presenting as candidates of the primary symmetry axes.
Status: VoR - Version of Record
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