Please use this identifier to cite or link to this item: http://hdl.handle.net/1893/34199
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dc.contributor.authorNowack, Vesnaen_UK
dc.contributor.authorBowes, Daviden_UK
dc.contributor.authorCounsell, Steveen_UK
dc.contributor.authorHall, Tracyen_UK
dc.contributor.authorHaraldsson, Saemunduren_UK
dc.contributor.authorWinter, Emilyen_UK
dc.contributor.authorWoodward, Johnen_UK
dc.contributor.editorJin, Zhien_UK
dc.contributor.editorLi, Xuandongen_UK
dc.contributor.editorXiang, Jianwenen_UK
dc.contributor.editorMariani, Leonardoen_UK
dc.contributor.editorLiu, Tingen_UK
dc.contributor.editorYu, Xiaoen_UK
dc.contributor.editorIvaki, Nahgmehen_UK
dc.date.accessioned2022-04-27T00:05:17Z-
dc.date.available2022-04-27T00:05:17Z-
dc.date.issued2022en_UK
dc.identifier.urihttp://hdl.handle.net/1893/34199-
dc.description.abstractAutomatic Program Repair (APR) has been proposed to help developers and reduce the time spent repairing programs. Recent APR tools have applied learned templates (fix patterns) to fix code using knowledge from fixes successfully applied in the past. However, there is still no general agreement on the representation of fix patterns, making their application and comparison with a baseline difficult. As a consequence, it is also difficult to expand fix patterns and further enable APR. We automatically generate fix patterns from similar fixes and compare the generated fix patterns against a state-of-the-art taxonomy. Our automated approach splits fixes into smaller, method-level chunks and calculates their similarity. A threshold-based clustering algorithm groups similar chunks and finds matches with state-of-the-art fix patterns. In our evaluation, we present 33 clusters whose fix patterns were generated from the fixes of 835 Defects4J bugs. Of those 33 clusters, 22 matched a state-of-the-art taxonomy with good agreement. The remaining 11 clusters were thematically analysed and generated new fix patterns that expanded the taxonomy. Our new fix patterns should enable APR researchers and practitioners to expand their tools to fix a greater range of bugs in the future.en_UK
dc.language.isoenen_UK
dc.publisherIEEE Computer Societyen_UK
dc.relationNowack V, Bowes D, Counsell S, Hall T, Haraldsson S, Winter E & Woodward J (2022) Expanding Fix Patterns to Enable Automatic Program Repair. In: Jin Z, Li X, Xiang J, Mariani L, Liu T, Yu X & Ivaki N (eds.) 32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021. 2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE), Wuhan, China, 25.10.2021-28.10.2021. Piscataway, NJ, USA: IEEE Computer Society, pp. 12-23. https://doi.org/10.1109/ISSRE52982.2021.00015en_UK
dc.rights© 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_UK
dc.subjectautomatic program repairen_UK
dc.subjectsimilarity metricen_UK
dc.subjectclusteringen_UK
dc.subjectfix patternen_UK
dc.titleExpanding Fix Patterns to Enable Automatic Program Repairen_UK
dc.typeConference Paperen_UK
dc.identifier.doi10.1109/ISSRE52982.2021.00015en_UK
dc.citation.issn2332-6549en_UK
dc.citation.spage12en_UK
dc.citation.epage23en_UK
dc.citation.publicationstatusPublisheden_UK
dc.type.statusAM - Accepted Manuscripten_UK
dc.citation.btitle32nd IEEE International Symposium on Software Reliability Engineering, ISSRE 2021en_UK
dc.citation.conferencedates2021-10-25 - 2021-10-28en_UK
dc.citation.conferencelocationWuhan, Chinaen_UK
dc.citation.conferencename2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)en_UK
dc.citation.date11/02/2022en_UK
dc.citation.isbn9781665425872en_UK
dc.publisher.addressPiscataway, NJ, USAen_UK
dc.contributor.affiliationQueen Mary, University of Londonen_UK
dc.contributor.affiliationLancaster Universityen_UK
dc.contributor.affiliationBrunel Universityen_UK
dc.contributor.affiliationLancaster Universityen_UK
dc.contributor.affiliationComputing Scienceen_UK
dc.contributor.affiliationLancaster Universityen_UK
dc.contributor.affiliationQueen Mary, University of Londonen_UK
dc.identifier.scopusid2-s2.0-85126395598en_UK
dc.identifier.wtid1807687en_UK
dc.contributor.orcid0000-0003-0395-5884en_UK
dc.date.accepted2021-07-31en_UK
dcterms.dateAccepted2021-07-31en_UK
dc.date.filedepositdate2022-04-26en_UK
rioxxterms.apcnot requireden_UK
rioxxterms.typeConference Paper/Proceeding/Abstracten_UK
rioxxterms.versionAMen_UK
local.rioxx.authorNowack, Vesna|en_UK
local.rioxx.authorBowes, David|en_UK
local.rioxx.authorCounsell, Steve|en_UK
local.rioxx.authorHall, Tracy|en_UK
local.rioxx.authorHaraldsson, Saemundur|0000-0003-0395-5884en_UK
local.rioxx.authorWinter, Emily|en_UK
local.rioxx.authorWoodward, John|en_UK
local.rioxx.projectInternal Project|University of Stirling|https://isni.org/isni/0000000122484331en_UK
local.rioxx.contributorJin, Zhi|en_UK
local.rioxx.contributorLi, Xuandong|en_UK
local.rioxx.contributorXiang, Jianwen|en_UK
local.rioxx.contributorMariani, Leonardo|en_UK
local.rioxx.contributorLiu, Ting|en_UK
local.rioxx.contributorYu, Xiao|en_UK
local.rioxx.contributorIvaki, Nahgmeh|en_UK
local.rioxx.freetoreaddate2022-04-26en_UK
local.rioxx.licencehttp://www.rioxx.net/licenses/all-rights-reserved|2022-04-26|en_UK
local.rioxx.filenameAPR_Similarity_Metric_Paper.pdfen_UK
local.rioxx.filecount1en_UK
local.rioxx.source9781665425872en_UK
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