Please use this identifier to cite or link to this item: http://hdl.handle.net/1893/3203
Appears in Collections:Computing Science and Mathematics Conference Papers and Proceedings
Peer Review Status: Refereed
Author(s): Niazi, Muaz A K
Hussain, Amir
Baig, Abdul Rauf
Bhatti, Saeed
Contact Email: man@cs.stir.ac.uk
Title: Simulation of the research process
Editor(s): Mason, Scott
Hill, Ray
Mönch, Lars
Rose, Oliver
Citation: Niazi MAK, Hussain A, Baig AR & Bhatti S (2008) Simulation of the research process. In: Mason S, Hill R, Mönch L & Rose O (eds.) Winter Simulation Conference, 2008. WSC 2008. Winter Simulation Conference, WSC. Winter Simulation Conference, 2008, Miami, Florida, 07.12.2008-10.12.2008. Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), pp. 1326-1334. https://doi.org/10.1109/WSC.2008.4736206
Issue Date: 2008
Date Deposited: 25-Jul-2011
Series/Report no.: Winter Simulation Conference, WSC
Conference Name: Winter Simulation Conference, 2008
Conference Dates: 2008-12-07 - 2008-12-10
Conference Location: Miami, Florida
Abstract: This paper presents first steps towards the development of a formal model of the research process. We evaluate the use of simulation as a tool for the evaluation of research strategies in nascent research organizations faced with the absence of significant data. We start by modeling the research process by using the ”Publish or Perish” paradigm, a well-known criteria of evaluation of research. We demonstrate the use of this model for researchers to evaluate the effects of selection of a particular publishing venue over time. We then perform various experiments using this basic idea. By means of various visualization techniques, we see how researchers with similar publishing policies might self-organize in the form of groups. We also evaluate the effects of giving higher weights to articles in journals and see where the effects of publishing in these venues breaks even for both top as well as average acceptance rates.
Status: VoR - Version of Record
Rights: Published in Winter Simulation Conference, 2008. WSC 2008 by Institute of Electrical and Electronics Engineers (IEEE).; © 2008 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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