Please use this identifier to cite or link to this item: http://hdl.handle.net/1893/31707
Full metadata record
DC FieldValueLanguage
dc.contributor.authorElawady, Mohameden_UK
dc.contributor.authorDucottet, Christopheen_UK
dc.contributor.authorAlata, Olivieren_UK
dc.contributor.authorBarat, Cecileen_UK
dc.contributor.authorColantoni, Philippeen_UK
dc.date.accessioned2020-09-23T00:00:57Z-
dc.date.available2020-09-23T00:00:57Z-
dc.date.issued2017-10en_UK
dc.identifier.urihttp://hdl.handle.net/1893/31707-
dc.description.abstractSymmetry is one of the significant visual properties inside an image plane, to identify the geometrically balanced structures through real-world objects. Existing symmetry detection methods rely on descriptors of the local image features and their neighborhood behavior, resulting incomplete symmetrical axis candidates to discover the mirror similarities on a global scale. In this paper, we propose a new reflection symmetry detection scheme, based on a reliable edge-based feature extraction using Log-Gabor filters, plus an efficient voting scheme parameterized by their corresponding textural and color neighborhood information. Experimental evaluation on four single-case and three multiple-case symmetry detection datasets validates the superior achievement of the proposed work to find global symmetries inside an image.en_UK
dc.language.isoenen_UK
dc.publisherIEEEen_UK
dc.relationElawady M, Ducottet C, Alata O, Barat C & Colantoni P (2017) Wavelet-Based Reflection Symmetry Detection via Textural and Color Histograms. In: 2017 IEEE International Conference on Computer Vision Workshops (ICCVW). 2017 IEEE International Conference on Computer Vision Workshop (ICCVW), Venice, 22.10.2017-29.10.2017. Piscataway, NJ, USA: IEEE. https://doi.org/10.1109/iccvw.2017.202en_UK
dc.rights© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.en_UK
dc.subjectFeature extractionen_UK
dc.subjectImage edge detectionen_UK
dc.subjectImage color analysisen_UK
dc.subjectHistogramsen_UK
dc.subjectFrequency-domain analysisen_UK
dc.subjectColoren_UK
dc.titleWavelet-Based Reflection Symmetry Detection via Textural and Color Histogramsen_UK
dc.typeConference Paperen_UK
dc.identifier.doi10.1109/iccvw.2017.202en_UK
dc.citation.issn2473-9944en_UK
dc.citation.publicationstatusPublisheden_UK
dc.type.statusAM - Accepted Manuscripten_UK
dc.citation.btitle2017 IEEE International Conference on Computer Vision Workshops (ICCVW)en_UK
dc.citation.conferencedates2017-10-22 - 2017-10-29en_UK
dc.citation.conferencelocationVeniceen_UK
dc.citation.conferencename2017 IEEE International Conference on Computer Vision Workshop (ICCVW)en_UK
dc.citation.isbn9781538610343en_UK
dc.publisher.addressPiscataway, NJ, USAen_UK
dc.contributor.affiliationUniversité Jean Monneten_UK
dc.contributor.affiliationUniversité Jean Monnet (Saint-Etienne, France)en_UK
dc.contributor.affiliationUniversité Jean Monnet (Saint-Etienne, France)en_UK
dc.contributor.affiliationUniversité Jean Monnet (Saint-Etienne, France)en_UK
dc.contributor.affiliationUniversité Jean Monnet (Saint-Etienne, France)en_UK
dc.identifier.isiWOS:000425239601086en_UK
dc.identifier.scopusid2-s2.0-85046270953en_UK
dc.identifier.wtid1658195en_UK
dc.contributor.orcid0000-0002-4930-3825en_UK
dc.date.accepted2017-07-01en_UK
dcterms.dateAccepted2017-07-01en_UK
dc.date.filedepositdate2020-09-22en_UK
rioxxterms.apcnot requireden_UK
rioxxterms.typeConference Paper/Proceeding/Abstracten_UK
rioxxterms.versionAMen_UK
local.rioxx.authorElawady, Mohamed|0000-0002-4930-3825en_UK
local.rioxx.authorDucottet, Christophe|en_UK
local.rioxx.authorAlata, Olivier|en_UK
local.rioxx.authorBarat, Cecile|en_UK
local.rioxx.authorColantoni, Philippe|en_UK
local.rioxx.projectInternal Project|University of Stirling|https://isni.org/isni/0000000122484331en_UK
local.rioxx.freetoreaddate2020-09-22en_UK
local.rioxx.licencehttp://www.rioxx.net/licenses/all-rights-reserved|2020-09-22|en_UK
local.rioxx.filenameiccv-paper-wavelet.pdfen_UK
local.rioxx.filecount1en_UK
local.rioxx.source9781538610343en_UK
Appears in Collections:Computing Science and Mathematics Conference Papers and Proceedings

Files in This Item:
File Description SizeFormat 
iccv-paper-wavelet.pdfFulltext - Accepted Version4.18 MBAdobe PDFView/Open


This item is protected by original copyright



Items in the Repository are protected by copyright, with all rights reserved, unless otherwise indicated.

The metadata of the records in the Repository are available under the CC0 public domain dedication: No Rights Reserved https://creativecommons.org/publicdomain/zero/1.0/

If you believe that any material held in STORRE infringes copyright, please contact library@stir.ac.uk providing details and we will remove the Work from public display in STORRE and investigate your claim.